XTOP 2018 – the 14th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging

XTOP brings together scientists from the fields of X-ray diffractometry, reflectometry, standing waves, coherent and conventional X-ray diffraction imaging and topography, as well as X-ray absorption and phase contrast imaging. XTOP is thus one of the central scientific conference concerning methods and instrumentation in laboratory and synchrotron-based high-resolution X-ray diffraction methods, phase contrast imaging, and micro-tomography.